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Burkhard Kaulich

Publications and source records attributed to Burkhard Kaulich.

3 recordsLinked to original sources

Condenser for Koehler-like illumination in transmission x-ray microscopes at undulator sources.

We report on a novel condenser for full-field transmission x-ray microscopes that use synchrotron radiation from an undulator source. The condenser produces a Koehler-like homogeneous intensity distribution in the sample plane and eliminates object illumination problems connected with the high degree of spatial coherence in an undulator beam. The optic consists of a large number of small linear diffraction gratings and is therefore relatively easy to manufacture. First imaging experiments with a prototype condenser were successfully performed with the Twinmic x-ray microscope at the Elettra synchrotron facility in Italy.

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Surface electromigration patterns in a confined adsorbed metal film: Ga on GaN.

The mass transport of gallium adatoms in a confined gallium bilayer on GaN(0001) is studied with photoelectron spectromicroscopy with the goal to identify the diffusing species and their lateral distribution during directional surface electromigration and/or "random" thermal diffusion. It has been found that only the gallium atoms from the second layer undergo biased diffusion involving formation of three-dimensional islands. The development of different gallium concentration patterns is described by means of a general model, considering the presence of vacancies and trapping centres for the diffusing atoms.

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Differential interference contrast x-ray microscopy with twin zone plates.

X-ray imaging in differential interference contrast (DIC) with submicrometer optical resolution was performed by using a twin zone plate (TZP) setup generating focal spots closely spaced within the TZP spatial resolution of 160 nm. Optical path differences introduced by the sample are recorded by a CCD camera in a standard full-field imaging and by an aperture photodiode in a standard scanning transmission x-ray microscope. Applying this x-ray DIC technique, we demonstrate for both the full-field imaging and scanning x-ray microscope methods a drastic increase in image contrast (approximately 20x) for a low-absorbing specimen, similar to the Nomarski DIC method for visible-light microscopy.

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