Biomedical subjects

C S Own

Publications and source records attributed to C S Own.

4 recordsLinked to original sources

PubMed2006

Prospects for aberration corrected electron precession.

Recent developments in aberration control in the TEM have yielded a tremendous enhancement of direct imaging capabilities for studying atomic structures. However, aberration correction also has substantial benefits for achieving ultra-resolution in the TEM through reciprocal space techniques. Several tools are available that allow very accurate detection of the electron distribution in surfaces allowing precise atomic-scale characterization through statistical inversion techniques from diffraction data. The precession technique now appears to extend this capability to the bulk. This article covers some of the progress in this area and details requirements for a next-generation analytical diffraction instrument. An analysis of the contributions offered by aberration correction for precision electron precession is included.

Journal Article↗

PubMed2006

Precession electron diffraction 1: multislice simulation.

Precession electron diffraction (PED) is a method that considerably reduces dynamical effects in electron diffraction data, potentially enabling more straightforward solution of structures using the transmission electron microscope. This study focuses upon the characterization of PED data in an effort to improve the understanding of how experimental parameters affect it in order to predict favorable conditions. A method for generating simulated PED data by the multislice method is presented and tested. Data simulated for a wide range of experimental parameters are analyzed and compared to experimental data for the (Ga,In)(2)SnO(4) (GITO) and ZSM-5 zeolite (MFI) systems. Intensity deviations between normalized simulated and kinematical data sets, which are bipolar for dynamical diffraction data, become unipolar for PED data. Three-dimensional difference plots between PED and kinematical data sets show that PED data are most kinematical for small thicknesses, and as thickness increases deviations are minimized by increasing the precession cone semi-angle phi. Lorentz geometry and multibeam dynamical effects explain why the largest deviations cluster about the transmitted beam, and one-dimensional diffraction is pointed out as a strong mechanism for deviation along systematic rows. R factors for the experimental data sets are calculated, demonstrating that PED data are less sensitive to thickness variation. This error metric was also used to determine the experimental specimen thickness. R(1) (unrefined) was found to be about 12 and 15% for GITO and MFI, respectively.

Computer Simulation↗

PubMed2005

Rapid structure determination of a metal oxide from pseudo-kinematical electron diffraction data.

The electron precession diffraction technique is employed to provide quasi-kinematical data for determination of atom positions in the (Ga,In)2SnO5m-phase. Precession data are compared with conventional diffraction data captured under identical conditions and show a distinct superiority because they exhibit kinematical characteristics in the structure-defining reflections. Precessed data are not usable within a kinematical interpretation in all cases, and a simple basis is presented for omission of errant reflections to improve adherence to kinematical behavior. A second approach is demonstrated where intensities are used with direct methods instead of amplitudes, enhancing the contrast between strong and weak beams. The unrefined atom positions recovered a priori via direct methods are consistent between the two approaches and fall on average within 4 picometers of positions in the previously refined structure.

Journal Article↗

PubMed2005

EDM 1.0: electron direct methods.

A computer program designed to provide a number of quantitative analysis tools for high-resolution imaging and electron diffraction data is described. The program includes basic image manipulation, both real space and reciprocal space image processing, Wiener-filtering, symmetry averaging, methods for quantification of electron diffraction patterns and two-dimensional direct methods. The program consists of a number of sub-programs written in a combination of C++, C and Fortran. It can be downloaded either as GNU source code or as binaries and has been compiled and verified on a wide range of platforms, both Unix based and PC's. Elements of the design philosophy as well as future possible extensions are described.

Image Processing, Computer-Assisted↗