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Chenggen Quan

Publications and source records attributed to Chenggen Quan.

7 recordsLinked to original sources

Measurement of a fiber-end surface profile by use of phase-shifting laser interferometry.

We describe a laser interferometric system in which two objectives are used to measure surface profile on a connectorized fiber-end surface. By the use of the proposed illumination design a He-Ne laser as a point light source is transformed to an extended light source, which is beneficial to localize interference fringe pattern near the test surface. To obtain an optimal contrast of the interference fringe pattern, the flat mirror with an adjustable reflection ratio is used to suit different test surfaces. A piezoelectric transducer attached on the reference mirror can move precisely along the optical axis of the objective and permits implementation of four-step phase-shifting interferometry without changing the relative position between the CCD sensor and the test surface. Therefore, an absolutely constant optical magnification can be accurately kept to capture the interference fringe patterns resulting from a combination of light reflected from both the reference flat mirror and the test surface. The experimental result shows that surface profile on a fiber-end with surface features such as a small fiber diameter of 125 microm and a low reflection ratio of less than 4% are measurable. Measurements on a standard calibration ball show that the accuracy of the proposed setup is comparable with that of existing white-light interferometers and stylus profilometers.

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Spatial-fringe-modulation-based quality map for phase unwrapping.

The quality-guided algorithm is a method widely used in phase unwrapping. The algorithm uses a quality map to guide its unwrapping process, and its validity depends on whether the quality map can truly reflect phase quality. In fringe projection surface profilometry, discontinuous surface structure, low surface reflectivity, and saturation of the image-recording system are sources of unreliable phase data. To facilitate the unwrapping process, we demonstrate an accurate quality map based on spatial fringe modulation, which is extracted from a single fringe pattern. Compared with temporal fringe modulation, the new criterion is more sensitive to spatial structure changes and less dependent on illumination conditions.

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Height measurement of microchip connecting pins by use of stereovision.

A stereovision method for estimating the height of connecting pins on a microchip is described. The technique uses a centroidal method to simplify the calculation. A few seconds are required for a Pentium 586 PC to calculate the heights of 300 connecting pins on a 50 mm x 50 mm microchip. The method is described, and experimental results are presented. The optical system, which consists of two CCD cameras with long-focal-length lenses and a two-channel digital image grabber, is capable of in situ measurement.

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Shape measurement by use of liquid-crystal display fringe projection with two-step phase shifting.

The use of an optical fringe projection method with two-step phase shifting for three-dimensional (3-D) shape measurement of small objects is described. In this method, sinusoidal linear fringes are projected onto an object's surface by a programmable liquid-crystal display (LCD) projector and a long-working-distance microscope (LWDM). The image of the fringe pattern is captured by another LWDM and a CCD camera and processed by a phase-shifting technique. Usually a minimum of three phase-shifted fringe patterns is necessary for extraction of the object shape. In this method, a new algorithm based on a two-step phase-shifting technique produces the 3-D object shape. Unlike in the conventional method, phase unwrapping is performed directly by use of an arccosine function without the need for a wrapped phase map. Hence, shape measurement can be speeded up greatly with this approach. A small coin is evaluated to demonstrate the validity of the proposed measurement method, and the experimental results are compared with those of the four-step phase-shifting method and the conventional mechanical stylus method.

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Development of a laser-scattering-based probe for on-line measurement of surface roughness.

The design and properties of an optical probe for on-line measurement of surface roughness are discussed. Based on light scattering, a probe that consists of a laser diode, a measuring lens, and a linear photodiode array was designed to detect surface roughness, in which the light scattered from a test surface at a relatively large scattering angle phi (=28 degrees) can be collected to enhance measuring range and repeatability. A coaxial design that incorporates a dual-laser probe and compressed air makes the proposed system insensitive to the position of the test surface and to surface conditions such as the presence of debris, vibration, and lubricants that result from machining. The results from measurements of several sets of specimens have demonstrated the feasibility of measuring surface roughness by using light scattering. On-line measurement on a diamond-turning lathe has shown that the proposed technique is stable and compact enough to be applicable to on-line measurement of surface roughness of an engineering surface.

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Proposed algorithm for phase unwrapping.

A new, to our knowledge, two-dimensional phase-unwrapping algorithm is proposed. The algorithm, which is based on the global continuity of physical information (e.g. the three-dimensional surface profile of an object) being measured, uses the principle of least-phase difference to rectify errors caused by an erroneous 2pi-phase jump in the initial unwrapped phase map obtained by the conventional phase-unwrapping method. Experimental results show that the proposed algorithm works well on a phase map that contains error sources, such as noises, phase discontinuity of more than pi, and insufficient sampling. Moreover, the algorithm is most suitable for unwrapping a phase map generated during shape measurement with a step-change surface on the test object, which is usually a critical problem in shape measurement.

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Investigation of membrane deformation by a fringe projection method.

An optical method has been developed to measure the deformation of a membrane in a microphone. A fringe projector that consists of an optical fiber and an optical wedge is described and analyzed by geometric optics. A three-step phase-shifting technique that involves the introduction of an arbitrary phase is discussed. The fine fringe patterns projected onto a small test surface are captured by a CCD camera mounted on a long-distance microscope. With the aid of a phase-shifting technique and signal-demodulating techniques, the proposed setup is capable of measuring deformation of the membrane of the order of as much as submicrometers.

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