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Clemens Barth

Publications and source records attributed to Clemens Barth.

3 recordsLinked to original sources

Surface structure of an ultrathin alumina film on Ni3Al(111): a dynamic scanning force microscopy study.

The surface structure of an ultrathin alumina film on a Ni3Al(111) substrate has been studied by dynamic scanning force microscopy. The alumina film exhibits a hexagonal superstructure with a lattice parameter of 4.14 nm and a (1/sqrt[3] x 1/sqrt[3])R30 degrees substructure. Two domains rotated by 24 degrees are present. The film is terminated by a hexagonal lattice of oxygen ions with a lattice parameter of 0.293 nm, which is rotated by 30 degrees with respect to the substrate lattice. The nodes of the 4.14 nm superstructure and the 2.39 nm substructure are pinned on points of the substrate lattice, where the surface atomic lattice is almost commensurable. The oxygen lattice is perfectly hexagonal close to these nodes and disordered in the surrounding regions.

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Measuring site-specific cluster-surface bond formation.

Recent advances in dynamic force microscopy show that it is possible to measure the forces between atomically sharp tips and particular atomic positions on surfaces as a function of distance. However, on most ionic surfaces, the positive and negative ions can so far not be distinguished. In this paper, we use the CaF2(111) surface, where atomic resolution force microscopy has allowed identification of the positions of the Ca2+ and F- ions in the obtained images, to demonstrate that short-range interaction forces can be measured selectively above chemically identified surface sites. Combining experimental and theoretical results allows a quantification of the strength and distance dependence of the interaction of a tip-terminating cluster with particular surface ions and reveals details of cluster and surface relaxation. Further development of this approach will provide new insight into mechanisms of chemical bond formation between clusters, cluster deposition at surfaces, processes in adhesion and tribology, and single atom manipulation with the force microscope.

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Atomic resolution imaging of the (001) surface of UHV cleaved MgO by dynamic scanning force microscopy.

The (001) surface of UHV cleaved single MgO crystals was imaged with dynamic mode scanning force microscopy. Large-scale images show various defects, like steps of mostly one atomic height, rectangular holes of nanometer size, and some complex adstructures. First time images with atomic resolution show one square ionic sublattice in its bulklike dimension with a corrugation of up to 40 pm along the <001> direction. Most images exhibit atomic point defects which appear as depressions including a few ionic lattice sites proving that point defects are stable on flat terraces.

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