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D Blavette

Publications and source records attributed to D Blavette.

12 recordsLinked to original sources

Modeling image distortions in 3DAP.

A numerical model has been developed to simulate images obtained from the three-dimensional atom probe. This model was used to simulate the artefacts commonly observed in two-phase materials. This model takes into account the dynamic evolution of the atomic-scale shape of the specimen during field evaporation. This article reviews the model and its applications to some specific cases. Local magnification effects were studied as a function of the size, the shape, and the orientation of precipitated phases embedded in the matrix. Small precipitates produce large aberrations in good agreement with experiments. The magnification from such precipitates, as measured from the simulation, is only found to match the theoretical value for mesoscopic scale precipitates (size similar to the specimen size). Orientation effects are also observed in excellent agreement with experiments. The measured thickness of a grain-boundary-segregated film in the simulation is found to decrease with the angle between the normal to the grain boundary and the tip axis. Depth scaling artefacts caused by variation in the evaporation field of atoms in multilayer structures were successfully simulated and again showed good agreement with effects observed experimentally.

Alloys↗

Hardening of aged duplex stainless steels by spinodal decomposition.

Mechanical properties, such as hardness and impact toughness, of ferrite-containing stainless steels are greatly affected by long-term aging at intermediate temperatures. It is known that the alpha-alpha' spinodal decomposition occurring in the iron-chromium-based ferrite is responsible for this aging susceptibility. This decomposition can be characterized unambiguously by atom probe analysis, allowing comparison both with the existing theories of spinodal decomposition and the evolution of some mechanical properties. It is then possible to predict the evolution of hardness of industrial components during service, based on the detailed knowledge of the involved aging process.

Chromium↗

Application of Fourier transform and autocorrelation to cluster identification in the three-dimensional atom probe.

Because of the increasing number of collected atoms (up to millions) in the three-dimensional atom probe, derivation of chemical or structural information from the direct observation of three-dimensional images is becoming more and more difficult. New data analysis tools are thus required. Application of a discrete Fourier transform algorithm to three-dimensional atom probe datasets provides information that is not easily accessible in real space. Derivation of mean particle size from Fourier intensities or from three-dimensional autocorrelation is an example. These powerful methods can be used to detect and image nano-segregations. Using three-dimensional 'bright-field' imaging, single nano-segregations were isolated from the surrounding matrix of an iron-copper alloy. Measurement of the inner concentration within clusters is, therefore, straightforward. Theoretical aspects related to filtering in reciprocal space are developed.

Journal Article↗

A new approach to the interpretation of atom probe field-ion microscopy images.

The field distribution and the ion trajectories close to the tip surface are known to mainly control the contrast of field-ion microscopy and the resolution of the three-dimensional atom probe. The proper interpretation of images provided by these techniques requires the electric field and the ion trajectories to be determined accurately. A model has been developed in order to compute the ion trajectories close to a curved emitting surface modelled at the atomic scale. In this model, both the gradual change of the tip surface and the chemical nature of atoms were taken into account. Predictions and results given by this approach are shown to be in excellent agreement with experiments. The calculated electric field at the tip surface is consistent with field-ion microscopy contrasts. The preferential retention of surface atoms and the order of evaporation were correctly simulated. The ion trajectories were successfully described. In this way, the crucial problem of trajectory overlap and local magnification could be investigated. These simulations not only lead to a new understanding of the physical basis of image formation, but also have a predictive value.

Journal Article↗

A model accounting for spatial overlaps in 3D atom-probe microscopy.

The spatial resolution of three-dimensional atom probe is known to be mainly controlled by the aberrations of ion trajectories near the specimen surface. An analytical model accounting for the spatial overlaps that occur near phase interfaces is described. This model makes it possible to correct the apparent composition of small spherical precipitates in order to determine the true composition. The prediction of the overlap rate as a function of the particle size was found in remarkably good agreement with the simulations of ion trajectories that were made. The thickness of the mixed zone around beta precipitates was found to be of 0.3 nm for a normalised evaporation field of beta phase of 0.8. Using simulations, the overlap rate could be parameterised as a function of the apparent atomic density observed in particles. This model has been applied to copper precipitation in FeCu.

Journal Article↗

Structural analyses in three-dimensional atom probe: a Fourier transform approach.

The three-dimensional atom probe (3DAP) technique gives the elemental identities and the position of atoms within the small volume analysed (on the order of 10 x 10 x 100 nm(3)). The large number of atoms collected (up to two million) and the excellent spatial resolution of this instrument allows the observation of some crystallographic features of phases chemically identified. This paper shows that the application of a discrete Fourier transform algorithm to a 3DAP dataset provides information that is not easily accessible in real space. The derivation of the mean size of particles from Fourier intensities is an example. Using 3D 'dark-field' imaging, single ordered grains were isolated from the disordered matrix of a ternary alloy. Moreover, the intrinsic spatial resolution of the instrument was evaluated by this method for pure metal; the resolution reaches 0.2 nm laterally and 0.06 nm in depth. This excellent resolution is shown to be sufficient to give access to the crystalline lattice. The use of image filtering in the reciprocal space enables for atomic columns to be imaged the first time from 3DAP data.

Journal Article↗

Imaging the three orientation variants of the DO22 phase by 3D atom probe microscopy.

Three-phase NiAlV alloys were investigated using a three-dimensional atom probe. Ageing at 800 degrees C gives rise to the precipitation of two ordered phases within the supersaturated FCC solid solution, namely Ni3Al (L1(2) structure) and Ni3V (DO22 structure). The DO22 phase has three orientation variants which need to be identified in 3DAP images. It is shown that an appropriate choice of analysis site enables us to image the chemical order within both L1(2) and DO22 ordered phases and to distinguish the three orientation variants of the DO22 phase in reconstructed images. The lateral resolution of 3DAP in these experimental conditions was estimated through simple considerations to be less than 0.3 nm.

Journal Article↗

The spatial resolution of 3D atom probe in the investigation of single-phase materials

The resolution of three-dimensional atom probe (3DAP) is known to be mainly controlled by the aberrations of the ion trajectories near the surface of the specimen. A model has been developed to compute the ion trajectories in 3D near a sharp hemispherical electrode defined at the atomic scale. Simulations were applied on one-phase binary alloys. The influence of the evaporation fields of chemical species is studied. Simulated desorption images are consistent with experiments in both ordered alloys and random solid solution. An extra loss in the lateral resolution is observed in disordered alloys as compared to pure metals. The predicted order of evaporation provided by this model is in excellent agreement with experiments. The stacking sequence of atomic planes reconstructed from simulated data is shown to be disturbed in a similar way as observed in real experiments with 3DAP.

Journal Article↗

Three-dimensional atomic-scale imaging of impurity segregation to line defects

Clouds of impurity atoms near line defects are believed to affect the plastic deformation of alloys. Three-dimensional atom probe techniques were used to image these so-called Cottrell atmospheres directly. Ordered iron-aluminum alloys (40 atomic percent aluminum) doped with boron (400 atomic parts per million) were investigated on an atomic scale along the <001> direction. A boron enrichment was observed in the vicinity of an <001> edge dislocation. The enriched region appeared as a three-dimensional pipe 5 nanometers in diameter, tangent to the dislocation line. The dislocation was found to be boron-enriched by a factor of 50 (2 atomic percent) relative to the bulk. The local boron enrichment is accompanied by a strong aluminum depletion of 20 atomic percent.

Journal Article↗

Tomographic Atom Probe: New Dimension in Materials Analysis.

: Materials science requires the use of increasingly powerful tools in materials analysis. The last 20 years have witnessed the development of a number of analytical techniques. However, among these techniques, only a few allow observation and analysis of materials at the nanometer level. The tomographic atom probe (TAP) is a three-dimensional atom-probe (3-DAP) developed at the University of Rouen. In this instrument, the specimen is field evaporated, atomic layer by atomic layer, and the use of a position-sensing system makes it possible to map out the chemical identity of individual atoms within each field-evaporated layer on a nearly atomic scale. After analysis, the volume of matter removed from the specimen can be reconstructed atom by atom in the three dimensions of real space. The main advantages of the 3-DAP is its single-atom sensitivity and very high spatial resolution. In addition to 3-D visual information on chemical heterogeneity, 3-D images give an accurate measurement of the composition of any feature without any convolution bias. This study first describes the history of the 3-DAP technique. Its main features and the latest developments of the TAP are then detailed. The performance of this instrument is illustrated through two recent applications in materials science. Possible ways to further improve the technique are also discussed.

Journal Article↗

The shape of field emitters and the ion trajectories in three-dimensional atom probes

The lateral resolution of three-dimensional atom probes is mainly controlled by the aberrations of the ion trajectories near the specimen surface. For the first time, a simulation program has been developed to reconstruct the ion trajectories near a sharp hemispherical electrode defined at the atomic scale. Surface atoms submitted to the highest field were removed one by one. The consecutive gradual change of the surface topology was taken into account in the calculation of ion trajectories. As the tip was 'field evaporated', the initial spherical shape of the emitter was observed to transform gradually into a polygonal shape. When the tip reached its equilibrium shape, the field distribution at the tip surface was found to be much more uniform compared to the initial distribution. The calculated distribution of ion impacts on the detector exhibits the presence of depleted zones both at the centre of low index poles and along <001> zone axes. These predictions are in excellent agreement with experiments.

Journal Article↗

A new step towards the lattice reconstruction in 3DAP.

The spatial resolution of images produced by 3DAP is known not to be limited by the detector performance but by the physics of field ionisation and field evaporation. This resolution can be expressed by two parameters: the depth resolution and the lateral resolution, which have been shown to achieve, respectively, 0.06 and 0.2nm in an ideal case of a pure metal. By using this model and these values, the resolution along any crystallographic direction can be predicted. In addition, it is possible to predict the suitable sites of analysis where a given type of atomic planes can be resolved. Furthermore, it is shown that three types of planes with non-coplanar directions can be imaged in 3D reconstructed volumes. Thus, the reconstruction of the original tungsten lattice can be achieved with the use of Fourier Transform image analysis techniques. It is shown that the reliability of the method can be achieve the value of 90%.

Journal Article↗