X-ray photoelectron-diffraction study of intermixing and morphology at the Ge/Si(001) and Ge/Sb/Si(001) interface.
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Biomedical subjects
De Crescenzi M
Publications and source records attributed to De Crescenzi M.
Interface ordering in Sim/Gen monolayer superlattices: A photoluminescence study.
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Inelastic processes versus diffraction effects: Polar-angle energy-loss spectra of the graphite K edge.
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Auger-electron diffraction in the low kinetic-energy range: The Si(111)7 x 7 surface reconstruction and Ge/Si interface formation.
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Evidence of KL double-electron excitations in x-ray photoemission spectra of solids: The case of MgO and MgF2.
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Topographic and spectroscopic analysis of ethylene adsorption on Si(111)7 x 7 by STM and STS.
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X-ray-photoemission-spectroscopy study of the surface deterioration of Bi2Sr2CaCu2O8 and Bi1.7Pb0.3Sr2CaCu2O8 single crystals at 26 K.
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Core-level changes induced by oxygen in YBa2Cu3O7- delta.
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Bremsstrahlung-isochromat-spectroscopy and x-ray-photoelectron-spectroscopy investigation of the electronic structure of beta -FeSi2 and the Fe/Si(111) interface.
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Palladium clusters on graphite: Evidence of resonant hybrid states in the valence and conduction bands.
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Short-range local order of the Co/Si(111) interface studied by the extended Auger fine-structure technique.
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Extended fine Auger structure spectroscopy of Ag and Cu.
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Co/Si(111) interface investigated by bremsstrahlung isochromat spectroscopy and x-ray-induced photoemission spectroscopy.
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Structural determination of crystalline silicon by extended energy-loss fine-structure spectroscopy.
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Core-level electron-energy-loss spectroscopy as a local probe for the electronic structure of the Co/Si(111) interface.
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Valence charge fluctuations in YBa2Cu3O7- delta from core-level spectroscopies.
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Origin and structural sensitivity of surface Auger extended fine structure.
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Cu/Ag(111) interface studied by surface electron energy-loss fine-structure spectroscopy.
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