Experimental technique for radiative-process-resolved X-ray absorption spectroscopy at the inner-shell excitation thresholds.
Partial-fluorescence-yield (PFY) x-ray absorption measurements, rising the optimized window widths of position sensitive detectors in wave-length dispersive x-ray spectrometers, have been applied for radiative process-resolved (RPR) x-ray absorption spectroscopy. We have measured PFY-absorption spectra of graphite and diamond at the C K threshold and of h-BN and c-BN at the B K threshold. Resonant elastic x-ray scattering was observed in graphite and h-BN on their PFY-absorption spectra, and excitonic x-ray scattering was observed in diamond and c-BN. These results show that PFY-absorption measurements for RPR x-ray absorption spectroscopy can provide the information about the electronic structures and the radiative-decay process in inner-shell excitation.