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Ivan Avrutsky

Publications and source records attributed to Ivan Avrutsky.

9 recordsLinked to original sources

Concept of a miniature optical spectrometer using integrated optical and micro-optical components.

We describe the concept of a super compact diffractive imaging spectrometer, with optical components a few millimeters across in all dimensions, capable of detecting optical fluorescence spectra within the entire visible spectral range from 400 nm to 700 nm with resolution of the order of 2 nm. In addition, the proposed spectrometer is capable of working simultaneously with multiple, up to 35, independent input optical channels. A specially designed diffractive optical element integrated with a planar optical waveguide is the key component of the proposed device. In the preliminary experimental tests, a uniform waveguide grating with a microlens was used to mimic operation of the diffractive optical element. A microspectrometer with optical components measured below 1 cm in all dimensions covers the spectral range from 450 nm to 650 nm and shows a spectral resolution of 0.5 nm at wavelengths close to 514 nm and 633 nm.

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Titania, silicon dioxide, and tantalum pentoxide waveguides and optical resonant filters prepared with radio-frequency magnetron sputtering and annealing.

Mixing dielectric materials in solid-thin-film deposition allows the engineering of thin films' optical constants to meet specific thin-film-device requirements, which can be significantly useful for optoelectronics devices and photonics technologies in general. In principle, by use of radio-frequency (rf) magnetron sputtering, it would be possible to mix any two, or more, materials at different molar ratios as long as the mixed materials are not chemically reactive in the mixture. This freedom in material mixing by use of magnetron sputtering has an advantage by providing a wide range of the material optical constants, which eventually enables the photonic-device designer to have the flexibility to achieve optimal device performance. We deposited three combinations from three different oxides by using rf magnetron sputtering and later investigated them for their optical constants. Each two-oxide mixture was done at different molar ratio levels. Moreover, postdeposition annealing was investigated and was shown to reduce the optical losses and to stabilize the film composition against environmental effects such as aging and humidity exposure. These investigations were supported by the fabricated planar waveguides and optical resonant filters.

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Experimental characterization of simultaneous spatial and spectral filtering by an optical resonant filter.

Simultaneous spatial and spectral filtering by an optical resonant filter has been characterized experimentally to furnish additional insight into the operation and applications of optical resonant filters. Our experimental study can be useful for applications that depend on spatial filtering, spectral filtering, spatial-spectral filtering, and polarization selectivity. One significant application is the integration of an optical resonant filter with semiconductor lasers to control the spatial-spectral radiation for optimum performance.

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Fabrication methods of optical resonant filters with a close-to-rectangle filtering profile.

The potential applications of optical resonant filters for optical communication systems can be significant. Three approaches to achieve a close-to-rectangle filtering profile for optical resonant filter were investigated and proven experimentally. The combination of the filtering sharpness, which comes from the resonance nature, and a flattened filtering window realized the close-to-rectangle filtering profile that can enhance the bandwidth efficiency.

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High-resolution photometric optical monitoring for thin-film deposition.

Real-time monitoring of thin-film deposition with high resolution is important for precise fabrication of thin-film devices in a technological environment with ever-increasing demands for smaller size and better performance. Using photometry, we were able to achieve a real-time optical monitoring resolution of film thickness that is comparable with a single atomic layer scale (i.e., subnanometer). Filtering noise efficiently and compensating for sources of error by use of an appropriate model produced this high resolution. The procedure proved reliable and can be useful in the thin-film-deposition industry.

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Heat treatment for reduction of surface roughness on holographic gratings.

Controlled postdevelopment heat treatment of the photoresist polymer used in the preparation of holographic gratings has been shown to enhance the diffraction efficiency of gratings and reduce the scattering losses. We prove this effect by analyzing the resonant reflection spectra of a waveguide grating and observing the reduction in the arc-shaped light scattering associated with the excitation of waveguide modes.

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Reliable fabrication technologies for optical resonant filters.

A reliable technology for optical resonant filters can be useful for optoelectronics technologies, optical communications systems, and biomedical applications. Positioning the resonance at a specific target wavelength is challenging because of the sensitivity of placing a narrow spectral filtering window tothe error factors that are associated with the fabrication and characterization processes. We describe and prove experimentally two fabrication approaches to overcome this challenge.

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Guided modes in a uniaxial multilayer.

An algorithm is presented for simulation of guided modes in a multilayer uniaxial structure with each layer characterized by its own ellipsoid of refractive indices and direction of optical axis. The proposed approach is based on presenting an electromagnetic field in each layer as a linear combination of ordinary and extraordinary waves coupled through the boundary conditions. The problem is reduced to two dimensions by considering the waves with a given projection of the wave vector on the plane of the waveguide. No a priori assumption about the guided-mode polarization is required in this method. Hybrid polarized modes appear naturally as solutions of a system of linear equations with respect to the amplitudes of the ordinary and extraordinary waves. The proposed approach covers a wide variety of important practical cases including isotropic waveguides, surface waves at the boundary between positive uniaxial crystal and isotropic medium, surface plasmons at metallic interfaces, uniaxial multilayers in a very general form, and leaky modes in such structures.

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