Biomedical subjects

Ivan U Vakarelski

Publications and source records attributed to Ivan U Vakarelski.

8 recordsLinked to original sources

PubMed2006

Nonlinear friction characteristics between silica surfaces in high pH solution.

Molecular-scale characteristics of friction forces between silica particles and silica wafers in aqueous solutions of the normal (pH 5.6) and high pH (pH 10.6) are investigated, using the lateral force measuring procedure of the atomic force microscope (AFM). Various significant differences of friction characteristics between solutions of normal and high pH's are found. In the case of solutions of normal pH, the friction force increases linearly with increasing loading force, as the Amonton's law for solid bodies indicates. However, in the case of high pH solutions, the increasing rate with the loading force is considerably reduced in the low loading region, but the value increases abruptly above a critical loading force to overcome the magnitude of friction force of normal pH above the region of very high loading. It is very interesting to know that this nonlinear force curve at high pH is independent of the atomic-scale roughness of surfaces, although the magnitude of friction is greatly influenced by the roughness in the case of normal pH. The reason why the friction at high pH is independent of the surface roughness is postulated to be due to the hairy-like layer formed on the silica surface. The existence of hairy-like layers at high pH is proven directly by the dynamic method of normal force measurements with AFM and the thickness is estimated to be at least ca. 1.3 nm.

Journal Article↗

PubMed2006

Single-nanoparticle-terminated tips for scanning probe microscopy.

We have developed a wet-chemistry procedure to attach a 10-40 nm colloidal gold nanoparticle to the top of a scanning probe microscopy (SPM) probe tip, making experiments of single nanoparticle interaction possible. This procedure of particle attachment is flexible and can be modified to attach nanoparticles of different kinds and sizes. The single-nanoparticle-terminated tips also have potential in various other applications, such as probes of enhanced sensitivity for optical and magnetic modes SPM.

Journal Article↗

PubMed2006

Parameters affecting the adhesion strength between a living cell and a colloid probe when measured by the atomic force microscope.

In this study, we used the colloid probe atomic force microscopy (AFM) technique to investigate the adhesion force between a living cell and a silica colloid particle in a Leibovitz's L-15 medium (L-15). The L-15 liquid maintained the pharmaceutical conditions necessary to keep the cells alive in the outside environment during the AFM experiment. The force curves in such a system showed a steric repulsion in the compression force curve, due to the compression of the cells by the colloid probe, and an adhesion force in the decompression force curve, due to binding events between the cell and the probe. We also investigated for the first time how the position on the cell surface, the strength of the pushing force, and the residence time of the probe at the cell surface individually affected the adhesion force between a living cell and a 6.84 microm diameter silica colloid particle in L-15. The position of measuring the force on the cell surface was seen not to affect the value of the maximum adhesion force. The loading force was also seen not to notably affect the value of the maximum adhesion force, if it was small enough not to pierce and damage the cell. The residence time of the probe at the cell surface, however, clearly affected the adhesion force, where a longer residence time gave a larger maximum force. From these results, we could conclude that the AFM force measurements should be made using a loading force small enough not to damage the cell and a fixed residence time, when comparing results of different systems.

Aluminum Silicates↗

PubMed2006

Effects of cleaning procedures of silica wafers on their friction characteristics.

Silicon wafers with thermal silicon oxide layers were cleaned and hydrophilized by three different methods: (1) the remote chemical analysis (RCA) wet cleaning by use of ammonia and hydrogen peroxide mixture solutions, (2) water-vapor plasma cleaning, and (3) UV/ozone combined cleaning. All procedures were found to remove effectively organic contaminations on wafers and gave identical characteristics of the contact angle, the surface roughness and the normal force interactions, measured by atomic force microscopy (AFM). However, it is found that wafers cleaned by the RCA method have several times larger friction coefficients than those cleaned by the plasma and UV/ozone methods. The difference was explained by the atomic-scale topological difference induced during the RCA cleaning. This study reveals the lateral force microscopy as a very sensitive method to detect the microstructure of surfaces.

Journal Article↗

PubMed2005

pH dependence of friction forces between silica surfaces in solutions.

The pH dependence of the friction between a silica particle and a silica wafer was investigated using lateral force microscopy. Measurements were done in the range of 3.6 < or = pH < or = 10.6 and the effect of high loading force was also examined. It is found that the friction is independent of the pH of solutions and increases linearly with the applied load, when the pH is between 3.6 and 8.6. On the other hand, once the pH is above 9.0, the friction becomes extremely small and the dependence on the applied load becomes nonlinear. It is postulated that this transition is due to the development of a gel layer composed of polymer-like segments of silicilic acid anchored on the surface; at the lower applied load, this layer acts as a boundary lubricant between the surfaces, but, at the higher applied load, the entanglements of these segments and more direct contact between two solid surfaces leads to the increase of the friction. The effects found here are expected to play an important role in elucidating the basic mechanism of the planarization process of silica wafers.

Journal Article↗

PubMed2005

Silica surfaces lubrication by hydrated cations adsorption from electrolyte solutions.

Adsorption of hydrated cations on hydrophilic surfaces has been related to a variety of phenomena associated with the short-range interaction forces and mechanisms of the adhesive contact between the surfaces. Here we have investigated the effect of the adsorption of cations on the lateral interaction. Using lateral force microscopy (LFM), we have measured the friction force between a silica particle and silica wafer in pure water and in electrolyte solutions of LiCl, NaCl, and CsCl salts. A significant lubrication effect was demonstrated for solutions of high electrolyte concentrations. It was found that the adsorbed layers of smaller and more hydrated cations have a higher lubrication capacity than the layers of larger and less hydrated cations. Additionally, we have demonstrated a characteristic dependence of the friction force on the sliding velocity of surfaces. A mechanism for the observed phenomena based on the microstructures of the adsorbed layers is proposed.

Journal Article↗

PubMed2004

Mechanical and thermodynamic properties of surfactant aggregates at the solid-liquid interface.

Surfactants are widely used to stabilize colloidal systems in a variety of industrial applications through the formation of self-assembled aggregates at the solid-liquid interface. Previous studies have reported that the control of surfactant-mediated slurry stability can be achieved through the manipulation of surfactant chain length and concentration. However, a fundamental understanding of the mechanical and energetic properties of these aggregates, which may aid in the molecular-level design of these systems, is still lacking. In this study, experimentally measured force/distance curves between an atomic force microscope (AFM) tip and self-assembled surfactant aggregates on mica or silica substrates at concentrations higher than the bulk critical micelle concentration (CMC) were used to determine their mechanical and thermodynamic properties. The experimental curves were fitted to a model which describes the interaction between a hard sphere (tip) and a soft substrate (surfactant structures) based on a modified Hertz theory for the case of a thin elastic layer on a rigid substrate. The calculated mechanical properties were found to be in the same order of magnitude as those reported for rubber-like materials (e.g., polydimethylsiloxane (PDMS)). By integrating the force/distance curves, the energy required for breaking the surface aggregates was also calculated. These values are close to those reported for bulk-micelle formation.

Journal Article↗

PubMed2003

Role of interaction forces in controlling the stability and polishing performance of CMP slurries.

Chemical mechanical polishing (CMP) is an essential step in metal and dielectric planarization in multilayer microelectronic device fabrication. In the CMP process it is necessary to minimize the extent of surface defect formation while maintaining good planarity and optimal material removal rates. These requirements are met through the control of chemical and mechanical interactions during the polishing process by engineering the slurry chemistry, particulate properties, and stability. In this study, the performance of surfactant-stabilized silica CMP slurries at high pH and high ionic strengths are investigated with particular emphasis on the particle-particle and particle-substrate interactions. It is shown that for the design of consistently high performing slurries, stability of abrasive particles must be achieved under the dynamic processing conditions of CMP while maintaining sufficient pad-particle-wafer interactions.

Journal Article↗