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J B Kortright

Publications and source records attributed to J B Kortright.

5 recordsLinked to original sources

Depth profile of uncompensated spins in an exchange bias system.

We have used the unique spatial sensitivity of polarized neutron and soft x-ray beams in reflection geometry to measure the depth dependence of magnetization across the interface between a ferromagnet and an antiferromagnet. The net uncompensated magnetization near the interface responds to applied field, while uncompensated spins in the antiferromagnet bulk are pinned, thus providing a means to establish exchange bias.

Journal Article↗

Disorder-induced microscopic magnetic memory.

Using coherent x-ray speckle metrology, we have measured the influence of disorder on major loop return point memory (RPM) and complementary point memory (CPM) for a series of perpendicular anisotropy Co/Pt multilayer films. In the low disorder limit, the domain structures show no memory with field cycling--no RPM and no CPM. With increasing disorder, we observe the onset and the saturation of both the RPM and the CPM. These results provide the first direct ensemble-sensitive experimental study of the effects of varying disorder on microscopic magnetic memory and are compared against the predictions of existing theories.

Journal Article↗

Direct imaging and determination of the uncompensated spin density in exchange-biased CoO/(CoPt) multilayers.

Magnetic force microscopy (MFM) measurements were performed on an exchange-biased CoO/(CoPt) multilayer sample at 7.5 K. Applying an external magnetic field of up to 7 T saturates the ferromagnetic layer and the remaining uncompensated antiferromagnetic spins at the antiferromagnet-ferromagnet interfaces are imaged with high lateral resolution. The coupling between the uncompensated spins and the spins in the ferromagnet are found to be antiferromagnetic. Quantitative analysis of the MFM images revealed that 7% of the spins at the interface are uncompensated and contribute to the exchange biasing.

Journal Article↗

Modified magnetism at a buried Co/Pd interface resolved with X-ray standing waves.

Soft x-ray standing waves produced by a multilayer interference substrate add depth sensitivity to magnetic circular dichroism to resolve changes in Co magnetism across a 1 nm distance from the Co center to the Co-on-Pd interface of a Pd/Co/Pd trilayer with an in-plane magnetization. Large enhancements of the number of Co d holes, and of in-plane orbital and spin magnetic moments, are strongly localized at a thin, chemically modified interface layer. These results provide new insight into magnetic anisotropy at interfaces, and suggest a broad applicability of such standing wave measurements to interface magnetism studies.

Journal Article↗

Cross-sectional transmission electron microscopy of X-ray multilayer thin film structures.

A simple method for preparing cross-sectional transmission electron microscopy specimens and discussions of possible artifacts from specimen preparation and observation of x-ray multilayer thin film structures are presented. The specimen preparation method employs mechanical grinding and polishing to approximately 20 microns, followed by ion milling, without dimpling. Artifacts such as preferential ion milling and crystallization under the electron beam, as well as effects of Fresnel fringes at interfaces, are important factors in interpretation of the images. Care in identifying them is required to avoid erroneous results in studies of morphology and microstructures within the layers and at their interfaces. Example high-resolution TEM results of cross-sectional W/C, Ru/C, and Mo/Si multilayers are presented.

Artifacts↗