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J F Power

Publications and source records attributed to J F Power.

6 recordsLinked to original sources
PubMed2006

Light profile microscopy based on Raman and wavelength resolved luminescence contrast.

Light profile microscopy based on contrast from wavelength resolved Raman and luminescence measurements is demonstrated experimentally for the first time. A Raman/multispectral light profile microscope (RMSLPM) has been constructed based on a line profiling geometry in which the sample is irradiated with a tightly focused laser beam (of ten micrometers radius or less) behind a polished view surface and the resulting line image is dispersed over the wavelength using an imaging spectrograph. The instrumentation developed in this laboratory has a spectral resolution approaching 10 cm(-1) and an (actual) depth independent spatial resolution of 6-8 times the Rayleigh diffraction limit, limited at present by optical aberrations and alignment. The technique has the potential to image at approximately twice the Rayleigh diffraction limit. The spectral signatures reconstructed from a variety of common industrial polymers show excellent agreement with reference spectra from the literature, and may be used to identify individual layers in depth images of unknown materials. RMS-LPM image data based on luminescence contrast have also been used to provide concentration depth profiles of additives and degradation products in injection molded samples of high-density poly(ethylene) (HDPE).

Equipment Design↗
PubMed2005

Depth profiling of the optical absorption coefficient in ultraviolet-degraded poly(vinylchloride) films by dual beam light profile microscopy.

Dual beam laser light profile microscopy (LPM) was applied in this work to the depth mapping of the optical absorption coefficient in photo-degraded poly(vinyl chloride) films. Depth profiles followed the absorption coefficient of a conjugated polyene photoproduct at visible wavelengths in photolyzed films of approximately 200 mum thickness. Both continuous and layered (separable laminate) films were studied. The absorption coefficient profiles reconstructed from photo-degraded thin films showed the classic concentration profiles seen in the literature for PVC degraded in the presence of oxygen and nitrogen atmospheres. In the case of single thin layers with continuous properties, the depth profiles were smooth and regular with minimum spatial noise. In the LPM of laminate structures, more optical anomalies were present because of the multiply interfacial structures that appeared in both the images and the reconstructed depth profiles. Notwithstanding, it was possible to profile the optical absorption coefficient at a level of error comparable to standard microtome methods. The latter was determined by comparing the LPM results to a destructive layer-by-layer analysis performed in parallel on the imaged materials. The dual beam LPM method should be generally useful for establishing polyene concentration profiles in industrial materials produced by photochemical, thermal, and chemical degradation mechanisms.

Absorption↗
PubMed2004

Broadband light profile microscopy: a rapid and direct method for thin film depth imaging.

Light profile microscopy (LPM) is a recently developed technique of optical inspection that is used to record micrometer scale images of thin film cross-sections on a direct basis. This technique uses a novel right-angle imaging geometry that shows outstanding contrast for subtle interface structures and morphologies that are invisible to conventional methods of inspection. When laser sources are used for sample illumination, image contrast is provided by luminescence and elastic and/or inelastic scatter. When a white-light excitation source is used for LPM, primary contrast is obtained from elastic scatter, while secondary contrast results from refraction, secondary transmission, and secondary reflection from material phases. We term this mode of inspection broadband light profile microscopy (BB-LPM). It is implemented with a compact, easily aligned apparatus and minimal sample preparation, and it shows outstanding interface contrast similar to laser LPM. In this work we demonstrate BB-LPM as a method for direct imaging of the layers structures of a variety of thin film samples of industrial and manufacturing interest.

Anatomy, Cross-Sectional↗
PubMed2004

Dual beam light profile microscopy: a new technique for optical absorption depth profilometry.

Light profile microscopy (LPM) is a recently developed technique of optical inspection that is used to record micrometer-scale images of thin-film cross-sections on a direct basis. In single beam mode, LPM provides image contrast based on luminescence, elastic, and/or inelastic scatter. However, LPM may also be used to depth profile the optical absorption coefficient of a thin film based on a method of dual beam irradiation presented in this work. The method uses a pair of collimated laser beams to consecutively irradiate a film from two opposing directions along the depth axis. An average profile of the beam's light intensity variation through the material is recovered for each direction and used to compute a depth-dependent differential absorbance profile. This latter quantity is shown from theory to be related to the film's depth-dependent optical absorption coefficient through a simple linear model that may be inverted by standard methods of numerical linear algebra. The inverse problem is relatively well posed, showing good immunity to data errors. This profilometry method is experimentally applied to a set of well-characterized materials with known absorption properties over a scale of tens of micrometers, and the reconstructed absorption profiles were found to be highly consistent with the reference data.

Journal Article↗
PubMedDate not supplied

Managing farming systems for nitrate control: a research review from management systems evaluation areas.

The U.S. Department of Agriculture funded the Management Systems Evaluation Area (MSEA) research project in 1990 to evaluate effectiveness of present farming systems in controlling nitrate N in water resources and to develop improved technologies for farming systems. This paper summarizes published research results of a five-year effort. Most research is focused on evaluating the effectiveness of farming system components (fertilizer, tillage, water control, cropping systems, and soil and weather variability). The research results show that current soil nitrate tests reliably predict fertilizer N needed to control environmental and economic risks for crop production. A corn (Zea mays L.)-soybean [Glycine max (L.) Merr.] rotation usually controls risk better than continuous corn, but both may result in unacceptable nitrate leaching. Reduced tillage, especially ridge-till, is better than clean tillage in reducing risk. Tile drainage controls nitrate in ground water, but discharge may increase nitrate in surface waters. Sprinkler irrigation systems provide better water control than furrow irrigation because quantity and spatial variability of applied water is reduced. Present farming systems have two major deficiencies: (i) entire fields are managed uniformly, ignoring inherent soil variability within a field; and (ii) N fertilizer rates and many field practices are selected assuming normal weather for the coming season. Both deficiencies can contribute to nitrate leaching in parts of most fields.

Agriculture↗