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J F van der Veen

Publications and source records attributed to J F van der Veen.

4 recordsLinked to original sources

X-ray diffraction method for the investigation of contacts between solid surfaces.

A coherent X-ray scattering method for investigating the formation of the contact region between two solid surfaces is presented. Diffraction of X-rays from two crossed cylindrical quartz surfaces, coated with Cr and TiO(2), revealed a total contact area of 90 +/- 10 microm. In the so-called Hertz model for two surfaces in non-adhesive contact, this value is directly related to the displacement of the surfaces and the applied external force. Values of 40 +/- 3 nm for the displacement and 24 +/- 3 mN for the force are found. The method is also useful for studying liquids in confinement.

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Shearing interferometer for quantifying the coherence of hard x-ray beams.

We report a quantitative measurement of the full transverse coherence function of the 14.4 keV x-ray radiation produced by an undulator at the Swiss Light Source. An x-ray grating interferometer consisting of a beam splitter phase grating and an analyzer amplitude grating has been used to measure the degree of coherence as a function of the beam separation out to 30 microm. Importantly, the technique provides a model-free and spatially resolved measurement of the complex coherence function and is not restricted to high resolution detectors and small fields of view. The spatial characterization of the wave front has important applications in discovering localized defects in beam line optics.

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Focusing x-ray beams to nanometer dimensions.

We address the question: what is the smallest spot size to which an x-ray beam can be focused? We show that confinement of the beam within a narrowly tapered waveguide leads to a theoretical minimum beam size of the order of 10 nm (FWHM), the exact value depending only on the electron density of the confining material. This limit appears to apply to all x-ray focusing devices. Mode mixing and interference can help to achieve this spot size without the need for ultrasmall apertures.

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