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J J Riera-Diaz

Publications and source records attributed to J J Riera-Diaz.

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Model parameters estimation when the evoked potential recordings are affected by a random scale factor.

In many situations an important source of the average evoked potentials (EPs) variability is a random scale factor affecting each recording. As a result, the outcome of any EP detection method may be greatly affected. However, using an appropriate probabilistic model these scale factor can be estimated, and the performance of any available detection index improved by data rescaling. In this paper the Maximum Likelihood Estimators of the waveform of the response and the scale factor affecting both background noise and this waveform are obtained. Also, an iterative algorithm for model parameters estimation is presented and its convergence is examined in a simulation study. The Linear Discriminant function is computed using simulated test data in both situations, before and after rescaling of recordings. The performance of these statistics is evaluated by mean of ROC curves.

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