Biomedical subjects

M Paturzo

Publications and source records attributed to M Paturzo.

3 recordsLinked to original sources

PubMed2006

Phase-shifting point-diffraction interferometer developed by using the electro-optic effect in ferroelectric crystals.

A novel and simple phase-shifting point-diffraction interferometer using a z-cut lithium niobate wafer is proposed. The pinhole is realized by an optical lithography process, aluminum deposition, and subsequent lift-off on the surface of the wafer. The phase shifting is obtained by inducing the electro-optic effect along the z crystal axis. We demonstrate experimentally the possibility of retrieving an aberrated wavefront.

Journal Article↗

PubMed2006

Tunable two-dimensional hexagonal phase array in domain-engineered Z-cut lithium niobate crystal.

An optical phase array with tunable phase step is demonstrated. The phase array consists of a two-dimensional hexagonal lattice of inverted ferroelectric domains fabricated on a Z-cut lithium niobate substrate. The electro-optically tunable phase step is obtained by the application of an external electric field along the z axis of the crystal via transparent electrodes. Theoretical analysis and experimental results are presented, showing that a tunable and flexible adaptive optical illuminator device can be realized by combining the electro-optic tunability with the Talbot effect. Generation of a multiplicity of light patterns is shown.

Journal Article↗

PubMed2005

Two-dimensional mapping of electro-optic phase retardation in lithium niobate crystals by digital holography.

We demonstrate accurate two-dimensional mapping of the phase retardation induced by the electro-optic effect in lithium niobate crystals. Off-axis digital holography is used to investigate congruent z-cut crystals. The spatially resolved optical path difference is interferometrically measured while a linearly rising voltage ramp is applied to the crystal. This procedure provides information on the uniformity of crystals' electro-optic properties and offers the ability to detect the presence of defects that is of fundamental importance for reliable processing of photonic devices.

Journal Article↗