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Masud Mansuripur

Publications and source records attributed to Masud Mansuripur.

7 recordsLinked to original sources

Crystallization behavior of Ge-doped eutectic Sb70Te30 films in optical disks.

We report laser-induced crystallization behavior of binary Sb-Te and ternary Ge-doped eutectic Sb70Te30 thin film samples in a typical quadrilayer stack as used in phase-change optical disk data storage. Several experiments have been conducted on a two-laser static tester in which one laser operating in pulse mode writes crystalline marks on amorphous film or amorphous marks on crystalline film, while the second laser operating at low-power cw mode simultaneously monitors the progress of the crystalline or amorphous mark formation in real time in terms of the reflectivity variation. The results of this study show that the crystallization kinetics of this class of film is strongly growth dominant, which is significantly different from the crystallization kinetics of stochiometric Ge-Sb-Te compositions. In Sb-Te and Ge-doped eutectic Sb70Te30 thin-film samples, the crystallization behavior of the two forms of amorphous states, namely, as-deposited amorphous state and melt-quenched amorphous state, remains approximately same. We have also presented experiments showing the effect of the variation of the Sb/Te ratio and Ge doping on the crystallization behavior of these films.

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Estimation of thermal coefficients of magneto-optical media.

Previously we described a method for estimating the thermal conductivity of magneto-optic recording media. The method relies on identifying the laser power that brings the maximum temperature of the TbFeCo layer to as high as the Curie temperature. We extensively use a similar method to estimate the heat capacity of a dielectric layer, a TbFeCo layer, and an aluminum alloy layer of magneto-optic recording media. Measurements are conducted on static disks with a beam of light focused on a TbFeCo layer. The method has the advantage of thermal diffusion depending on a multilayer structure and irradiation time.

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Partial-response signaling for phase-change optical data storage without electronic equalization.

We describe the application of partial-response (PR) signaling in rewritable phase-change optical data storage. No electronic filter is necessary to shape the readout signal to a certain PR target. A PR-like waveform at the output of the read channel is directly achieved by optical recording. A genetic algorithm is used to optimize the parameters for writing and therefore to minimize the difference between the actual readout signal and the ideal PR waveform. With a laser wavelength of 0.66 microm and an objective lens with a numerical aperture of 0.6, four linear densities were examined: 0.4, 0.3, 0.25, and 0.2 microm/bit (without modulation). Results showed that the linear density of 0.25 microm/bit can be realized on a rewritable digital-versatile disk.

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Thermal properties and crystallization dynamics of a phase-change alloy for write-once optical data storage.

Using a two-laser static tester, we measured the crystallization temperature and the thermal conductivity of a phase-change alloy thin film used in write-once-read-many media of optical data storage. The experimental technique, in general, and the calibration procedures, in particular, are described. The measurement results are used as entry points into numerical calculations that ultimately yield estimates of the material parameters. Valuable information about the dynamics of mark formation (i.e., localized crystallization) in amorphous phase-change alloy films is obtained from the observed variations of the sample reflectance under short-pulse and long-pulse recording conditions. The dependence of these reflectance variations on the laser pulse power has also been investigated.

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Intensity, polarization, and phase information in optical disk systems.

Digital information in optical data storage systems can be encoded in the intensity, in the polarization state, or in the phase of a carrier laser beam. Intensity modulation is achieved at the surface of the storage medium either through destructive interference from surface-relief features (e.g., CD or DVD pits) or through reflectivity variations (e.g., alteration of optical constants of phase-change media). Magneto-optical materials make use of the polar magneto-optical Kerr effect to produce polarization modulations of the focused beam reflected from the storage medium. Both surface-relief structures and material-property variations can create, at the exit pupil of the objective lens of the optical pickup, a phase modulation (this, in addition to any intensity or polarization modulation or both). Current optical data storage systems do not make use of this phase information, whose recovery could potentially increase the strength of the readout signal. We show how all three mechanisms can be exploited in a scanning optical microscope to reconstruct the recorded (or embedded) data patterns on various types of optical disk.

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Measurement of the thermal coefficients of rewritable phase-change optical recording media.

We describe a method to estimate the heat capacity of the substrate, the dielectric layer, and the phase-change layer of phase-change optical recording media as well as the thermal conductivity of the phase-change layer in its crystalline state. Measurements were carried out on spinning disks with the beam of light focused and locked onto the groove track. The method relies on the identification of the solid-to-liquid phase transition that occurs in the phase-change layer and takes advantage of the dependence of thermal diffusion on track velocity and irradiation time.

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Optical characterization of multilayer stacks used as phase-change media of optical disk data storage.

We report results of measurements of the optical constants of the dielectric layer (ZnS-SiO2), reflecting layer (aluminum-chromium alloy), and phase-change layer (GeSbTe, AgInSbTe) used as the media of phase-change optical recording. The refractive index n and the absorption coefficient k of these materials vary to some extent with the film thickness and with the film deposition environment. We report the observed variations of optical constants among samples of differing structure and among samples fabricated in different laboratories.

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