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Biomedical subjects

Matthew Weyland

Publications and source records attributed to Matthew Weyland.

6 recordsLinked to original sources

Room design for high-performance electron microscopy.

Aberration correctors correct aberrations, not instabilities. Rather, as spatial resolution improves, a microscope's sensitivity to room environment becomes more noticeable, not less. Room design is now an essential part of the microscope installation process. Previously ignorable annoyances like computer fans, desk lamps and that chiller in the service corridor now may become the limiting factors in the microscopes performance. We discuss methods to quantitatively characterize the instrument's response to magnetic, mechanical, acoustical and thermal disturbances and thus predict the limits that the environment places on imaging and spectroscopy.

Journal Article↗

Highly anisotropic distribution of iron nanoparticles within MCM-41 Mesoporous Silica.

Electron microscopy techniques are used to visualize the spatial distribution of iron nanoparticles inside a mesoporous MCM-41 molecular sieve. Direct observation of the iron oxide nanoparticles by STEM-HAADF imaging reveals a highly non-uniform spatial distribution inside the mesopores. These particles are retained in the pores after a reduction treatment unlike the behavior found in other similar systems. It is found that thermal treatments induce changes in its morphology, creating nanowires from particle strings.

Image Processing, Computer-Assisted↗

Conventional and back-side focused ion beam milling for off-axis electron holography of electrostatic potentials in transistors.

Off-axis electron holography is used to characterize a linear array of transistors, which was prepared for examination in cross-sectional geometry in the transmission electron microscope (TEM) using focused ion beam (FIB) milling from the substrate side of the semiconductor device. The measured electrostatic potential is compared with results obtained from TEM specimens prepared using the more conventional 'trench' FIB geometry. The use of carbon coating to remove specimen charging effects, which result in electrostatic fringing fields outside 'trench' specimens, is demonstrated. Such fringing fields are not observed after milling from the substrate side of the device. Analysis of the measured holographic phase images suggests that the electrically inactive layer on the surface of each FIB-milled specimen typically has a thickness of 100 nm.

Journal Article↗

Extending energy-filtered transmission electron microscopy (EFTEM) into three dimensions using electron tomography.

The length scales on which materials microstructures are being formed, grown, and even designed are becoming increasingly small and increasingly three-dimensional. For such complex structures two-dimensional transmission electron microscopy (TEM) analysis is often inadequate and occasionally misleading. One approach to this problem is the modification of electron tomography techniques, developed for structural biology, for use in materials science. Energy-Filtered (EF) TEM elemental distribution images approximate to true projections of structure, and, as such, can be used to reconstruct the three-dimensional distribution of chemical species. A sample holder has been modified to allow the high tilt (+/-60 degrees ) required for tomography and a semiautomatic acquisition script designed to manage energy-loss acquisition. Tilt series data sets have been acquired from two widely different experimental systems, Cr carbides in 316 stainless steel and magnetite nanocrystals in magnetotactic bacteria, demonstrating single- and multiple-element tomography. It is shown that both elemental maps and jump-ratio images are suitable for reconstruction, despite the effects of diffraction contrast in the former and thickness changes in the latter. It is concluded that the image contrast, signal, and signal-to-noise ratio (SNR) are key to the achievable reconstruction quality and, as such, the technique may be of limited value for high energy loss/small inelastic cross section edges.

Electrons↗