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Michael W Anderson

Publications and source records attributed to Michael W Anderson.

6 recordsLinked to original sources
PubMed2004

Modern microscopy methods for the structural study of porous materials.

This article describes a number of important recent microscopy tools and their application in particular to the study of porous inorganic materials. The authors believe that these new techniques are on the threshold of delivering enormous new power in the chemist's arsenal for understanding new and complex behaviour in multi-component, hierarchical or composite materials. In particular we consider the contribution of electron crystallography, three-dimensional electron tomography, ultra-high resolution scanning electron microscopy as well as the combined application of high-resolution electron microscopy and atomic force microscopy to the study of surfaces and crystal growth. Much of this work has taken on a particular significance owing to the ground breaking work of scientists at Mobil and in Japan 10 years ago in the successful synthesis of materials with porosity on many length scales achieved through the cooperative self-assembly between inorganic and organic phases. This resulted in a series of materials known as M41S of which MCM-41 and MCM-48 were two of the first and most important structures to be synthesised. This has led to a wealth of new porous structures with order over many length scales and has presented new problems in characterisation. Microscopy methods properly executed are particularly important in the study of this new class of material.

Journal Article↗
PubMed2003

Atomic force microscopy study of the molecular sieve MnAPO-50.

Atomic force microscopy (AFM) imaging of MnAPO-50 reveals multiply-nucleated, elliptical terraces, oriented in registry with the facet edges with step heights ranging from one to six template repeat distances on the [100] facets and terraces with step heights ranging from one to thirty three times the c unit cell parameter on the [001] facets.

Journal Article↗
PubMed2003

Silicalite crystal growth investigated by atomic force microscopy.

Atomic force microscopy has been used to image the various facets of two morphologically distinct samples of silicalite. The smaller (20 microm) sample A crystals show 1 nm high radial growth terraces. The larger (240 microm) sample B crystals show growth terraces 1 to 2 orders of magnitude higher than the terraces on sample A with growth edges parallel to the crystallographic axes. Moreover, the terraces on the (010) face are significantly higher than the terraces on the (100) face - inconsistent with the previously proposed 90 degrees intergrowth structure. Sample A highlights that under certain synthetic conditions, silicalite grows in a manner akin to zeolites Y and A, via the deposition of layers comprising, in the case of silicalite, pentasil chains. It is probable that the rate of terrace advance is identical on the (010) and (100) faces, and it is the rate of terrace nucleation that dictates the overall growth rate of each facet and hence the relative size expressed in the final crystal morphology. Analysis of the growth terraces of sample B and detailed consideration of the structures of both MFI, and a closely related material MEL, lead to the proposal of a generalized growth mechanism for silicalite including the incorporation of defects within the structure. These defects are thought to be responsible for both the relative and the absolute terrace heights observed and may also explain the hourglass phenomenon observed by optical microscopy. The implications of this growth mechanism, supported by results of infrared microscopy, generate a new dimension to the continuing debate on the existence of intergrowths within one of the most important structures relevant to zeolite catalysis.

Journal Article↗