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Mikhail Yu Lavrentiev

Publications and source records attributed to Mikhail Yu Lavrentiev.

2 recordsLinked to original sources

Monte Carlo simulation of segregation in ceramic thin films.

A Monte Carlo exchange technique is used to study segregation in thin ceramic films with application to MgO/MnO. The approach is not restricted to the dilute limit. Surface concentrations as a function of temperature and film composition are determined directly from the simulations. For all compositions studied (Mn(chi)Mg(1-chi)O, 0 < or = chi < or = 1) the (001) surface is Mn(2+) rich; the occupancy of sites by Mn(2+) decreases rapidly with depth. The ratio of the number of Mn(2+) to Mg(2+) ions at the surface decreases as a function of temperature. The calculated enthalpies of segregation of Mn(2+) for the thin film are strongly dependent on the total Mn(2+) concentration at small Mn(2+) concentrations, with the enthalpy of segregation varying by a factor of two with surface coverage.

Ceramics↗

Simulating surface diffusion and surface growth in ceramics.

We examine the movement of ion pairs on the surfaces of simple oxides. Using temperature-accelerated dynamics the elementary processes involved are identified and the activation energies of these used as input to kinetic Monte Carlo simulations. Results are presented for the motion of BaO and SrO ion pairs on the (100) surfaces of BaO and SrO, respectively, and the formation of island pairs on these surfaces is studied. The simulations reveal the importance of exchange mechanisms in surface diffusion and growth of oxides. The importance of such reactions has been recognised previously for metallic surfaces but not for ionic systems, where it has been assumed that ionic surface diffusion is surface diffusion via the hopping motion of ion pairs from one surface site to another. Exchange mechanisms can dominate transport processes both on terraces and steps for both homoepitaxial and heteroepitaxial growth. We suggest the unavoidable mixing when an exchange mechanism operates must be considered when attempting to grow sharp interfaces in oxide nanostructures.

Journal Article↗