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Mitsuru Konno

Publications and source records attributed to Mitsuru Konno.

3 recordsLinked to original sources

Development of a gas injection/specimen heating holder for use with transmission electron microscope.

A new gas injection/specimen heating holder is developed for the purpose of in situ observation of gas reaction of materials at high temperatures in a transmission electron microscope at near-atomic resolution. A fine tungsten wire is employed as a heating element of the holder and a battery is used as the power source. Gas was injected onto specimens in the form of particles lying on the heating element via a nozzle. The maximum pressure near specimens was middle of 10(-2) Pa, while the pressure in the electron-gun chamber was kept to 2 x 10(-4) Pa. This gas injection/specimen heating holder was applied to observe solid-gas reactions. The reactions observed include oxidation of pure In into In2O3, reduction of SiO2 into Si and re-oxidation of Si into SiO2.

Journal Article↗

In situ high temperature TEM observation of interaction between multi-walled carbon nanotube and in situ deposited gold nano-particles.

Interaction between multi-walled carbon nanotubes (MWNTs) and deposited gold nano-particles has been dynamically observed in a 200 kV transmission electron microscope (TEM) using a specimen heating holder. Gold particles with diameters of several tens of microns were mixed with MWNTs to mount on the heating element of a specimen heating holder. The gold particles were instantaneously heated to 1373 K to deposit gold nano-particles on the MWNTs from a very short distance. The MWNTs were then heated to 1073 K to observe interaction between the deposited gold nano-particles and MWNTs. Some gold nano-particles drilled through the wall of the MWNT and entered the capillary space of the MWNTs. To characterize the mechanism of the transition of the gold nano-particles into the capillary space of the MWNT, high resolution TEM observation of the deformed wall of MWNT was also carried out.

Journal Article↗

A method for multidirectional TEM observation of a specific site at atomic resolution.

A new technique has been developed for the three-dimensional structure characterisation of a specific site at atomic resolution. In this technique, a focused ion beam (FIB) system is used to extract a specimen from a desired site as well as to fabricate the electron transparent specimen. A specimen holder with a specimen stage rotation mechanism has also been developed for use with both an FIB system and a high-resolution transmission electron microscope (TEM). The specimen holder allows both the FIB milling of a specimen and its observation in TEM without remounting the specimen from the specimen holder. A specimen for the three-dimensional TEM observation is extracted using the FIB micro-sampling technique and shaped into a pillar to mount on a tip of a needle stub enabling a multidirectional observation. The technique was applied to the multidirectional observation of the crystal structure of an Si single crystal at atomic resolution. The crystal lattice fringes of the two Si(111) planes with distances of 0.31 nm as well as the lattice fringes of the Si(200) with distances of 0.19 nm were clearly observed.

Imaging, Three-Dimensional↗