Solving an interface structure by electron microscopy and x-ray diffraction: The GaAs(001)-CdTe(111) interface.
Explore the source record for details and available documents.
Journal Article↗
Biomedical subjects
P Fuoss
Publications and source records attributed to P Fuoss.
Structural relaxation and defect annihilation in pure amorphous silicon.
Explore the source record for details and available documents.
Journal Article↗