Defect evolution in Co-implanted Si during annealing at 1000 degreesC studied using variable-energy positrons and Rutherford backscattering.
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Biomedical subjects
PJ Simpson
Publications and source records attributed to PJ Simpson.
Origin of the second length scale found above TN in UO2.
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Stopping Powers for Positrons and Electrons.
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Charging and double-frequency Aharonov-Bohm effects in an open system.
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X-ray- and neutron-scattering measurements of two length scales in the magnetic critical fluctuations of holmium.
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Depth profiling of hydrogen passivation of boron in Si(100).
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Ion-beam-induced damage in silicon studied using variable-energy positrons, Rutherford backscattering, and infrared absorption.
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Microvoid formation in low-temperature molecular-beam-epitaxy-grown silicon.
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