Quantitative Auger electron spectrometric depth profile analysis of binary alloy reference materials.
Using AES/sputtering, the binary alloy systems Ag/Cu, Ni/Cr and Pb/Sb ranging from 0 to 100% have been studied experimentally with respect to the shape of the calibration curve. The signal intensities are modified by the composition of the matrix. A formal description of the calibration line by a two-parameter approach is derived, including the matrix effect factors. This approach fits well all the experimental data. The significance of the individual matrix effects in these systems is indicated.
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