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SL Chang

Publications and source records attributed to SL Chang.

7 recordsLinked to original sources

The phenomenon of polarization suppression of X-ray Umweg multiple waves in crystals

The phenomenon of the polarization suppression of X-ray Umweg multiple waves in Renninger scans [Renninger (1937). Z. Kristallogr. 97, 107-121] of crystals, showing intensity decrease due to properly chosen wavelength and polarization of incident radiation, is observed. That is, one of the participating wave components in the multiple-wave interference is reduced considerably so that the intensity of multiple diffraction is decreased. The condition for total suppression of the multiple-wave interaction in crystals is derived theoretically from the Born approximation and verified with exact dynamical calculation and experiments. Partial suppression of the strong Umweg interfered component is demonstrated using elliptically or linearly polarized synchrotron radiation. The suppressed multiple-wave intensity distribution reveals high sensitivity to X-ray reflection phase. This multiple-diffraction technique under partial polarization suppression provides an alternative way of enhancing the visibility of multiple-wave interference in crystals for direct phase determination.

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Quantitative phase determination for macromolecular crystals using stereoscopic multibeam imaging.

Without invoking anomalous dispersion and heavy-atom derivatives, it is demonstrated that it is possible to directly determine the phases of a large number of reflections collected in a short time from macromolecular crystals using a stereoscopic oscillation-crystal imaging technique, in a multibeam diffraction geometry, where two crystallographic axes in opposite directions are employed as the rotation axes. The intensity profiles (distributions) of the diffraction spots versus the varying tilt Bragg angle of the rotation axis in the two stereoscopically related images yield quantitative phase information. Many multiple diffraction profiles of tetragonal lysozyme and an unknown protein structure are obtained at the rate of 100 profiles per 30 min of X-ray exposure.

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Dynamical calculation of crystal truncation rods for surfaces and interfaces using a Cartesian coordinate transformation technique.

A dynamical calculation scheme that employs Cartesian coordinates with a z axis normal to the crystal surface to define polarization unit vectors and wavefields is applied to interpret the intensity distribution of crystal truncation rods for surfaces and interfaces. A comparison between this calculation scheme and the asymptotic iteration approach using the conventional presentation of the polarization components of the wavefields, with the sigma and pi components perpendicular to the wavevectors, is presented. It is found that the use of Cartesian coordinate systems can provide correct boundary conditions in determining the wavefield amplitudes, thus leading to a rigorous and general calculation scheme for dynamical diffraction from surfaces and interfaces.

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Three-wave X-ray diffraction: an analysis scheme of the sensitivity in determining triplet phase invariants.

A model for analysing the phase sensitivity of the reflection coefficients of a diffracted wave in the case of three-wave X-ray diffraction is proposed. This model considers three-wave diffraction as the interference of the directly excited and the Umweg-excited diffracted waves and seems to account properly for the phase sensitivity as well as the behaviour of an involved diffracted wave as a function of the triplet phase invariant, the polarization state of the incident wave and the diffraction geometry. The practical issues for phase determination are also considered.

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Three-wave grazing-incidence X-ray diffraction from thin crystal surface layers: determination of triplet phase invariants.

Numerical calculation of the angular and spectral distributions of the intensities of the specularly diffracted waves in the case of three-wave grazing-incidence X-ray diffraction is carried out using the dynamical theory. The angular and spectral distributions are shown to be uniquely and continuously dependent upon the value of the triplet phase invariant. A method of determining the value of the triplet phase invariant for thin crystal surface layers is developed, based on the comparison of experimentally measured three-wave peak profiles with the profiles calculated for different values of the triplet phase invariant. An analysis scheme of the phase sensitivity of the reflection coefficients is proposed taking into account the interference of the directly excited and the 'Umweg'-excited specularly diffracted waves.

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