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Stefano Cattaneo

Publications and source records attributed to Stefano Cattaneo.

5 recordsLinked to original sources

Real-time monitoring of all-optical poling by two-beam second-harmonic generation.

We demonstrate a simple method for monitoring all-optical poling in real time. The poling pattern created by the writing beam at the fundamental frequency and the seed beam at the second-harmonic frequency is reconstructed by two-beam second-harmonic generation because of the writing beam and an additional probe beam at the fundamental frequency. When the probe beam is sufficiently weak, it does not distort the poling process. The method provides a significantly stronger signal than monitoring based on a probe beam alone.

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A regression technique to analyze the second-order nonlinear optical response of thin films.

We present a new technique, based on regression analysis, to determine the second-order nonlinear optical susceptibility tensor of thin films. The technique does not require the absolute levels or phases of measured signals to be mutually calibrated. In addition it yields indicators that address the quality of theoretical models describing the sample. We use the technique to determine the susceptibility tensor of samples of a nonracemic chiral material which have very low symmetry (both chiral and anisotropic) and have many independent tensor components. The results show the importance of using detailed theoretical models that account for the linear optical properties of the sample.

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Advantages of polarized two-beam second-harmonic generation in precise characterization of thin films.

Polarized second-harmonic generation using two fundamental beams, instead of one, offers significant advantages for characterizing nonlinear optical thin films. The technique is more precise and allows the internal consistency of the results to be verified. The superiority of the two-beam arrangement over the traditional single-beam arrangement is demonstrated by determining the susceptibility tensors of Langmuir-Blodgett films. We show that, for a well-understood reference sample, the results obtained using two fundamental beams agree qualitatively with those obtained with a single fundamental beam, but are more precise. In a more complicated situation, however, the single-beam technique appears to work well but yields results that are, in fact, incorrect. The two-beam technique, instead, yields clearly inconsistent results, thereby highlighting systematic errors in the experimental arrangement or in the theoretical model used to interpret the results.

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Determination of second-order susceptibility components of thin films by two-beam second-harmonic generation.

We measure the susceptibility components of a poled polymer film by second-harmonic generation with two beams at the fundamental frequency. The technique allows the consistency of experimental data and the validity of the theoretical model used to analyze the results to be addressed. Our results are in agreement with the expected values, provided that the linear optical properties of the sample are properly included.

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Nonlinear optical technique for precise retardation measurements.

We present a highly sensitive nonlinear optical technique to measure optical retardation. The technique is based on second-harmonic generation from thin films using two beams at the fundamental frequency. The sensitive polarization dependence of the process allows measuring optical retardation very precisely. The technique relies on fundamental symmetry principles and does therefore not require complicated experimental arrangement or data analysis. The technique was demonstrated by determining the retardation of a nominal half-wave plate to a precision and repeatability better than lambda/10(4).

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