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Tom D Milster

Publications and source records attributed to Tom D Milster.

3 recordsLinked to original sources

Evanescent imaging with induced polarization by using a solid immersion lens.

Image contrast enhancement, high lateral resolution, and height information are obtained with induced polarization evanescent imaging using a solid immersion lens. Experiments are conducted by imaging features on a patterned Si substrate. Imaging theory is used to predict optimum orientation of high-spatial-frequency samples, and a topographical image is derived from the induced polarization image through a calibration procedure. A numerical aperture of 1.5 is used in the experiment. Height accuracy of +/-2 nm is demonstrated with a known sample.

Journal Article↗

Performance of a write-once multilayer optical disk that uses transparent recording material with an optical switching layer.

A volumetric optical disk that has multiple transparent films with optical switching layers is used as a recording medium to increase the number of recording layers. In the disk the optical switching layer is adapted to reduce decay of laser energy and increase reading and recording sensitivity. Well-defined marks of approximately 100-nm depth can be placed precisely on the transparent films by a focused laser beam. Writing and reading of a four-layer recordable disk, fabricated by molding and spin bonding, have been demonstrated experimentally. The volumetric disk can achieve a high recording capacity with conventional optical pickups.

Journal Article↗

Interferometric phase reconstruction by nonuniform shifting of the reference beam.

A method for phase measurement in common-path interferometers, believed to be novel, is presented. We use the property of phase reconstruction algorithms, such as the Carré and Hariharan algorithms, that do not require uniform phase across the reference beam. Only the ratio of the phase steps must be the same at each pixel. We show phase measurement and reconstruction in a common-path interferometer by shifting either the tilt or the focus of the reference wave front. We present a theoretical explanation of phase measurement using this property. We also present results from a proof-of-principle experiment using a scatterplate interferometer, in conjunction with the tilt phase-shifting technique, to measure the reflected phase of a test optical element. Furthermore, we present a computer simulation to demonstrate the mathematical validity of this measurement technique using defocus shifting, rather than tilt shifting, in the reference wave front.

Journal Article↗