Biomedical subjects

Toshihiko Nakata

Publications and source records attributed to Toshihiko Nakata.

4 recordsLinked to original sources

PubMed2006

General solution of undersampling frequency conversion and its optimization for parallel photodisplacement imaging.

A general solution of undersampling frequency conversion and its optimization for parallel photodisplacement imaging is presented. Phase-modulated heterodyne interference light generated by a linear region of periodic displacement is captured by a charge-coupled device image sensor, in which the interference light is sampled at a sampling rate lower than the Nyquist frequency. The frequencies of the components of the light, such as the sideband and carrier (which include photodisplacement and topography information, respectively), are downconverted and sampled simultaneously based on the integration and sampling effects of the sensor. A general solution of frequency and amplitude in this downconversion is derived by Fourier analysis of the sampling procedure. The optimal frequency condition for the heterodyne beat signal, modulation signal, and sensor gate pulse is derived such that undesirable components are eliminated and each information component is converted into an orthogonal function, allowing each to be discretely reproduced from the Fourier coefficients. The optimal frequency parameters that maximize the sideband-to-carrier amplitude ratio are determined, theoretically demonstrating its high selectivity over 80 dB. Preliminary experiments demonstrate that this technique is capable of simultaneous imaging of reflectivity, topography, and photodisplacement for the detection of subsurface lattice defects at a speed corresponding to an acquisition time of only 0.26 s per 256 x 256 pixel area.

Journal Article↗

PubMed2006

Real-time photodisplacement microscope for high-sensitivity simultaneous surface and subsurface inspection.

We have developed a new photodisplacement microscope system for practical use that achieves high-sensitivity simultaneous real-time imaging of surface and subsurface structures from a single space-frequency multiplexed interferogram. In this system a linear region of photothermal displacement is excited on the sample surface for subsurface imaging by a line-focused intensity-modulated laser beam. Surface information such as reflectivity and topography along with the displacement is detected with a charge-coupled device sensor-based parallel heterodyne interferometer. Surface and subsurface information components are space-frequency multiplexed into the sensor signal as orthogonal functions based on a frequency-optimized undersampling scheme, allowing each to be discretely reproduced by using a real-time Fourier analysis technique. Preliminary experiments demonstrate that this system is effective, simultaneously imaging reflectivity, topography, and photodisplacement for the detection of subsurface lattice defects in silicon, at a remarkable speed of only 0.26 s/256x256 pixel area. This new microscope is promising for nondestructive hybrid surface and subsurface inspection and other applications.

Journal Article↗

PubMed2005

Simultaneous real-time imaging of surface and subsurface structures from a single space-frequency multiplexed photodisplacement interferogram.

A new parallel photodisplacement technique has been developed that achieves simultaneous real-time imaging of surface and subsurface structures from a single space-frequency multiplexed interferogram, which greatly simplifies the system and the optical alignment. A linear region of photodisplacement is excited on the sample for subsurface imaging by use of a line-focused intensity-modulated laser beam, and the displacement and surface information on reflectivity and topography are detected by a parallel heterodyne interferometer with a charge-coupled device linear image sensor used as a detector. The frequencies of three control signals for excitation and detection, that is, the heterodyne beat signal, modulation signal, and sensor gate pulse, are optimized such that surface and subsurface information components are space-frequency multiplexed into the sensor signal as orthogonal functions, allowing each to be discretely reproduced from Fourier coefficients. Preliminary experiments demonstrate that this technique is capable of simultaneous imaging of reflectivity, topography, and photodisplacement for the detection of subsurface lattice defects at a remarkable speed of only 0.26 s per 256 x 256 pixel area. This new technique is promising for use in nondestructive hybrid surface and subsurface inspection and other applications.

Journal Article↗

PubMed2004

Practical realization of high-speed photodisplacement imaging by use of parallel excitation and parallel heterodyne detection: a numerical study.

A new parallel photodisplacement technique that achieves extremely high-throughput imaging is proposed, and its practical realization is studied numerically. In this technique, a linear region of photothermal displacement is excited by use of a line-focusing intensity-modulated laser beam and detected with a parallel heterodyne interferometer in which a charge-coupled device linear image sensor is used. Because of the integration and sampling effects of the sensor, the interference light is spatiotemporally multiplexed. To extract the photodisplacement component from the multiplexed sensor signal, a scheme of phase-shifting light integration under an undersampling condition is proposed for parallel interferometry. The frequencies of several control signals, including the heterodyne beat signal, modulation signal, and sensor gate signal, are optimized so as to eliminate undesirable components, allowing only the displacement component to be extracted. Preliminary numerical simulation results show that the proposed technique has the potential to perform photodisplacement imaging more than 10,000 times faster than conventional photoacoustic microscopy.

Journal Article↗