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U Lienert

Publications and source records attributed to U Lienert.

4 recordsLinked to original sources

A conical slit for three-dimensional XRD mapping.

Traditionally, depth resolution in diffraction experiments is obtained by inserting pinholes in both the incoming and diffracted beam. For materials science investigations of local strain and texture properties this leads to very slow data-acquisition rates, especially when characterization is performed on the level of the individual grains. To circumvent this problem a conical slit has been manufactured by wire-electrodischarge machining. The conical slit has six 25 microm-thick conically shaped openings matching six of the Debye-Scherrer cones from a face-centred-cubic powder. By combining the slit with a microfocused incoming beam of hard X-rays, an embedded gauge volume is defined. Using a two-dimensional detector, fast and complete information can be obtained regarding the texture and strain properties of the material within this particular gauge volume. The average machining and assemblage errors of the conical slit are found both to be of the order of 5 microm. An algorithm for alignment of the slit is established, and the potential of the technique is illustrated with an example of grain mapping in a 4.5 mm-thick Cu sample.

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A scattering filter for energy-dispersive optics.

A filtering technique to remove parasitic scattering from X-ray absorption spectra that are acquired in energy-dispersive mode has been developed and tested at the European Synchrotron Radiation Facility. The improved set-up removes small-angle scattering of the sample or the windows of sample cells which may spoil the energy resolution or reduce the intensity of prominent features in the absorption spectrum, such as the white line at the Pt L(III) edge. The sample is placed behind the curved monochromator and between two plane perfect crystals in the Bonse-Hart configuration. The dispersion of the Bonse-Hart double-crystal camera is matched to the dispersion of the curved monochromator by inclining the scattering planes of the two optical elements against each other.

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Focusing Optics for High-Energy X-ray Diffraction.

Novel focusing optical devices have been developed for synchrotron radiation in the energy range 40-100 keV. Firstly, a narrow-band-pass focusing energy-tuneable fixed-exit monochromator was constructed by combining meridionally bent Laue and Bragg crystals. Dispersion compensation was applied to retain the high momentum resolution despite the beam divergence caused by the focusing. Next, microfocusing was achieved by a bent multilayer arranged behind the crystal monochromator and alternatively by a bent Laue crystal. A 1.2 micro m-high line focus was obtained at 90 keV. The properties of the different set-ups are described and potential applications are discussed. First experiments were performed, investigating with high spatial resolution the residual strain gradients in layered polycrystalline materials. The results underline that focused high-energy synchrotron radiation can provide unique information on the mesoscopic scale to the materials scientist, complementary to existing techniques based on conventional X-ray sources, neutron scattering or electron microscopy.

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Microfocusing of hard X-rays with cylindrically bent crystal monochromators.

High-energy X-ray focusing with bent-crystal monochromators is known to be hampered by so-called depth or crystal-thickness aberrations. A theoretical model of focus broadening based on the geometrical theory of X-ray diffraction in slightly deformed crystals is presented and compared with experimental data. First, it is shown that depth broadening can be avoided in the Laue geometry by an appropriate choice of asymmetry angle. Based on this finding, a monochromator for high-pressure diffraction experiments has been designed and a source-size-limited focal spot below 10 microns is observed. As a consequence of the box-shaped rocking curve of bent Laue crystals, the focus is free of long-ranging tails. Diffraction patterns of standard powder samples were recorded on imaging plates and a theoretical description of the energy-dispersion-related peak broadening is given. Finally, diffraction patterns of N2 at 180 kbar demonstrate the excellent data quality achievable with this monochromator.

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