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Vincent R Daria

Publications and source records attributed to Vincent R Daria.

4 recordsLinked to original sources

Spatial light modulator-controlled alignment and spinning of birefringent particles optically trapped in an array.

We demonstrate the use of a phase-only liquid-crystal spatial light modulator (SLM) for polarization-controlled rotation and alignment of an array of optically trapped birefringent particles. A collimated beam incident upon a two-dimensional lenslet array yields multiple foci, scaled to produce optical gradient traps with efficient three-dimensional trapping potentials. The state of polarization of each trapping beam is encoded by the SLM, which acts as a matrix of wave plates with computer-controlled phase retardations. Control of the rotation frequency and alignment direction of the particles is achieved by the transfer of tunable photon spin angular momentum.

Birefringence↗

Comment: Influence of illuminating beyond the object support on Zernike-type phase contrast filtering.

In this comment, we clarify some serious misinterpretations that can arise from an uncritical use of the results presented in [Appl. Opt. 41, 2607, (2002)]. In particular, we point out that their suggestion of using "illumination beyond the object support" for measuring phase disturbances can result in distorted or strongly inaccurate interference patterns. We also point out that Llave and Castillo have misinterpreted our previous work describing the effect of phase object fill factor on the output interference patterns, which is in fact one of the key factors considered in the generalized phase contrast (GPC) method. Unlike the Zernike method, the GPC method results in an optimized visualization of the phase disturbance by the achievement of a matching condition between the applied filter and the spatial average of a given phase disturbance, thereby implying the optimal use of fill factor information.

Comment↗

High-contrast images of semiconductor sites via one-photon optical beam-induced current imaging and confocal reflectance microscopy.

We demonstrate a computationally efficient procedure for determining only the semiconductor sites in a confocal reflectance image of an integrated circuit. It utilizes a one-photon optical beam-induced current (1P-OBIC) and confocal reflectance images that are generated from the same focused excitation beam. A 1P-OBIC image is a two-dimensional map of the currents induced by the beam as it is scanned across the circuit surface. A 1P-OBIC is produced by an illuminated semiconductor material if the excitation photon energy exceeds the bandgap. The 1P-OBIC image has no vertical resolution because the 1P-OBIC is linear with the excitation beam intensity. The exclusive high-contrast image of semiconductor sites is generated by the product of the 1P-OBIC image and the confocal image. High-contrast images of the metal sites are also obtained by the product of the complementary OBIC image and the same confocal image.

Journal Article↗