Viriya Vithayaveroj | PubMed Health

PubMed2005

Surface charge heterogeneities measured by atomic force microscopy.

Unfavorable aggregation and deposition of colloidal particles in natural and engineered systems is still a subject of debate. Complicating factors such as surface roughness, secondary minimum aggregation, and the nature of discrete surface charge and surface potential make it difficult to attribute a specific cause to these phenomena. The presence of surface charge heterogeneity and its influence on interaction forces, which are responsible for aggregation and deposition, are studied in this work through the application of atomic force microscopy (AFM). Force-volume-mode AFM was used to map interaction forces on a surface and relate them to surface charge heterogeneities. The experimental system consisted of a silica plate and a standard silicon nitride AFM tip. Copper ions were used for sorption on the silica surface in order to modify the surface charge and cause charge reversal. Different concentrations of copper ions were selected to identify conditions of partial coverage of the silica surface. The pH and ionic strength of the solutions were varied, and the extension of the surface charge modification and its influence on the resulting interaction forces were monitored via AFM force measurements. Depending on the pH and ionic strength, the interaction force was found to change at certain regions on the surface from attraction to either weak or strong repulsion. Force imaging allowed the visual localization of zones of strong repulsive interaction that diminished in size with increasing ionic strength. X-ray photoelectron spectroscopy analysis was used to confirm the presence of copper on the surface. Local charge differences on a surface result in local differences in surface forces, not only in magnitude but also in direction. This behavior may explain the aggregation, deposition, and transport of colloidal particles under unfavorable chemical conditions.

Colloids↗

PubMed2003

Copper uptake by silica and iron oxide under high surface coverage conditions: surface charge and sorption equilibrium modeling.

A sorption modeling approach based on surface complexation concepts was applied to predict copper uptake and its effects on the surface electrostatic potential of ferric oxide and silica colloids. Equilibrium modeling of copper uptake by ferric oxide using the traditional surface complexation model (SCM) was reasonably successful with some discrepancies especially in the acidic pH ranges and high colloid concentration cases. Good predictions of the ferric oxide charge reversals during uptake were obtained from the modeling. Based on the SCM predictions, copper removal from solution is due to the outer-sphere complexation of the first hydrolysis product, resulting in the surface-metal complex SO(-)CuOH(+). The SCM was found to be insufficient to describe copper uptake by silica particles. To address discrepancies between experimental data and SCM predictions, the SCM was modified to include attributes of the surface polymer model (SPM), which incorporates sorption of the dimeric copper species Cu(2)(OH)(2)(2+). The continuum model (CM) was also studied as a second modification to the SCM to include formation of surface precipitates. Both the SPM and the CM were successful in modeling copper uptake and zeta potential variations as a function of pH at various solution conditions and colloid concentrations. From the SPM and CM predictions, it was concluded that for systems with high surface loadings, copper removal from solution occurs due to the formation of both monomeric and dimeric surface complexes, as well as through precipitation mechanisms.

Journal Article↗