TY  - RPRT
TI  - Electronic-charge displacement around a stacking boundary in SiC polytypes.
AU  - A Qteish
AU  - V Heine
AU  - RJ Needs
PY  - 1992
DO  - 10.1103/physrevb.45.6376
UR  - https://pubmed.ncbi.nlm.nih.gov/10000401/
ID  - 10000401
ER  -