@misc{indiciae96e9276d5b57,
  title = {Electromigration in stressed thin films.},
  author = {KN Tu},
  year = {1992},
  doi = {10.1103/physrevb.45.1409},
  url = {https://pubmed.ncbi.nlm.nih.gov/10001620/},
  note = {Source identifier: 10001620}
}