TY  - RPRT
TI  - Defect processes in GaP: Implications for the behavior of excited surface defects.
AU  - GS Khoo
AU  - CK Ong
PY  - 1993
DO  - 10.1103/physrevb.47.9346
UR  - https://pubmed.ncbi.nlm.nih.gov/10005000/
ID  - 10005000
ER  -