TY  - RPRT
TI  - SiO2/Si interfacial structure on vicinal Si(100) studied with second-harmonic generation.
AU  - G Lüpke
AU  - DJ Bottomley
AU  - van Driel HM
PY  - 1993
DO  - 10.1103/physrevb.47.10389
UR  - https://pubmed.ncbi.nlm.nih.gov/10005148/
ID  - 10005148
ER  -