@misc{indiciaebeaa559acc30,
  title = {Determination of surface-defect concentration and distribution with He diffraction.},
  author = {WA Schlup and KH Rieder},
  year = {1986},
  doi = {10.1103/physrevlett.56.73},
  url = {https://pubmed.ncbi.nlm.nih.gov/10032532/},
  note = {Source identifier: 10032532}
}