TY  - RPRT
TI  - Determination of surface-defect concentration and distribution with He diffraction.
AU  - WA Schlup
AU  - KH Rieder
PY  - 1986
DO  - 10.1103/physrevlett.56.73
UR  - https://pubmed.ncbi.nlm.nih.gov/10032532/
ID  - 10032532
ER  -