TY  - RPRT
TI  - Crystallization instability at the amorphous-silicon/liquid-silicon interface.
AU  - JY Tsao
AU  - PS Peercy
PY  - 1987
DO  - 10.1103/physrevlett.58.2782
UR  - https://pubmed.ncbi.nlm.nih.gov/10034848/
ID  - 10034848
ER  -