TY  - RPRT
TI  - Comment on "Defects in amorphous silicon: A new perspective"
AU  - JC Phillips
PY  - 1987
DO  - 10.1103/physrevlett.58.2824
UR  - https://pubmed.ncbi.nlm.nih.gov/10034860/
ID  - 10034860
ER  -