@misc{indiciae0ed52e0449e2,
  title = {Controlled surface charging as a depth-profiling probe for mesoscopic layers},
  author = {I Doron-Mor and A Hatzor and A Vaskevich and van der Boom-Moav T and A Shanzer and I Rubinstein and H Cohen},
  year = {2000},
  doi = {10.1038/35019025},
  url = {https://pubmed.ncbi.nlm.nih.gov/10935629/},
  note = {Source identifier: 10935629}
}