TY  - RPRT
TI  - New structural model for Si/SiO2 interfaces derived from spherosiloxane clusters: implications for Si 2p photoemission spectroscopy
AU  - K Raghavachari
AU  - J Eng
PY  - 2000
DO  - 10.1103/physrevlett.84.935
UR  - https://pubmed.ncbi.nlm.nih.gov/11017409/
ID  - 11017409
ER  -