TY  - RPRT
TI  - Which is the optimal testing method for identifying an AV delay that allows intrinsic conduction?
AU  - L E Eguía
AU  - S L Pinski
AU  - J Haw
AU  - R G Trohman
PY  - 2000
DO  - 10.1111/j.1540-8159.2000.tb07013.x
UR  - https://pubmed.ncbi.nlm.nih.gov/11139918/
ID  - 11139918
ER  -