@misc{indiciae41a943d1930e,
  title = {Defect generation by hydrogen at the Si- SiO(2) interface.},
  author = {S N Rashkeev and D M Fleetwood and R D Schrimpf and S T Pantelides},
  year = {2001},
  doi = {10.1103/physrevlett.87.165506},
  url = {https://pubmed.ncbi.nlm.nih.gov/11690213/},
  note = {Source identifier: 11690213}
}