TY  - RPRT
TI  - Defect generation by hydrogen at the Si- SiO(2) interface.
AU  - S N Rashkeev
AU  - D M Fleetwood
AU  - R D Schrimpf
AU  - S T Pantelides
PY  - 2001
DO  - 10.1103/physrevlett.87.165506
UR  - https://pubmed.ncbi.nlm.nih.gov/11690213/
ID  - 11690213
ER  -