@misc{indiciae2435b98570f9,
  title = {Pattern-recognition methods to identify secondary structure within X-ray crystallographic electron-density maps.},
  author = {Thomas Oldfield},
  year = {2002},
  doi = {10.1107/s0907444902000525},
  url = {https://pubmed.ncbi.nlm.nih.gov/11856835/},
  note = {Source identifier: 11856835}
}