TY  - RPRT
TI  - Surface characterization techniques for determining the root-mean-square roughness and power spectral densities of optical components.
AU  - Angela Duparré
AU  - Josep Ferre-Borrull
AU  - Stefan Gliech
AU  - Gunther Notni
AU  - Jörg Steinert
AU  - Jean M Bennett
PY  - 2002
DO  - 10.1364/ao.41.000154
UR  - https://pubmed.ncbi.nlm.nih.gov/11900432/
ID  - 11900432
ER  -