@misc{indiciae9c7170134662,
  title = {Characterization of nitride thin films by electron backscatter diffraction.},
  author = {C Trager-Cowan and F Sweeney and J Hastie and S K Manson-Smith and D A Cowan and D McColl and A Mohammed and K P O'Donnell and D Zubia and S D Hersee and C T Foxon and I Harrison and S V Novikov},
  year = {2002},
  doi = {10.1046/j.1365-2818.2002.00996.x},
  url = {https://pubmed.ncbi.nlm.nih.gov/11996185/},
  note = {Source identifier: 11996185}
}