TY  - RPRT
TI  - Use of emission electron microscope for potential mapping in semiconductor microelectronics.
AU  - S A Nepijko
AU  - N N Sedov
AU  - G Schönhense
AU  - M Escher
PY  - 2002
DO  - 10.1046/j.1365-2818.2002.01012.x
UR  - https://pubmed.ncbi.nlm.nih.gov/12000552/
ID  - 12000552
ER  -