TY  - RPRT
TI  - Sampling effects influence heights measured with atomic force microscopy.
AU  - J B Heymann
AU  - C Möller
AU  - D J Müller
PY  - 2002
DO  - 10.1046/j.1365-2818.2002.01039.x
UR  - https://pubmed.ncbi.nlm.nih.gov/12135458/
ID  - 12135458
ER  -