TY  - RPRT
TI  - Fast surface profiler by white-light interferometry by use of a new algorithm based on sampling theory.
AU  - Akira Hirabayashi
AU  - Hidemitsu Ogawa
AU  - Katsuichi Kitagawa
PY  - 2002
DO  - 10.1364/ao.41.004876
UR  - https://pubmed.ncbi.nlm.nih.gov/12197656/
ID  - 12197656
ER  -