@misc{indiciaebe4e2ded1b2d,
  title = {Generalized far-infrared magneto-optic ellipsometry for semiconductor layer structures: determination of free-carrier effective-mass, mobility, and concentration parameters in n-type GaAs.},
  author = {Mathias Schubert and Tino Hofmann and Craig M Herzinger},
  year = {2003},
  doi = {10.1364/josaa.20.000347},
  url = {https://pubmed.ncbi.nlm.nih.gov/12570302/},
  note = {Source identifier: 12570302}
}