TY  - RPRT
TI  - Generalized far-infrared magneto-optic ellipsometry for semiconductor layer structures: determination of free-carrier effective-mass, mobility, and concentration parameters in n-type GaAs.
AU  - Mathias Schubert
AU  - Tino Hofmann
AU  - Craig M Herzinger
PY  - 2003
DO  - 10.1364/josaa.20.000347
UR  - https://pubmed.ncbi.nlm.nih.gov/12570302/
ID  - 12570302
ER  -